Nedestruktivní hloubkové profilování velmi tenkých kovových vrstev elektronově-spektroskopickými metodami
Nondestructive depth profiling of very thin metal layers by means of electron spectroscopic methods
diploma thesis (DEFENDED)
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http://hdl.handle.net/20.500.11956/7550Identifiers
Study Information System: 44578
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- Kvalifikační práce [11196]
Author
Advisor
Referee
Starý, Vladimír
Faculty / Institute
Faculty of Mathematics and Physics
Discipline
Physics of surfaces and ionized media
Department
Department of Surface and Plasma Science
Date of defense
13. 9. 2006
Publisher
Univerzita Karlova, Matematicko-fyzikální fakultaLanguage
Czech
Grade
Very good