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Materials for Solar Cells Based on Thin Silicon Films
dc.creatorFekete, Ladislav
dc.date.accessioned2021-05-19T16:15:50Z
dc.date.available2021-05-19T16:15:50Z
dc.date.issued2006
dc.identifier.urihttp://hdl.handle.net/20.500.11956/4853
dc.description.abstractThin lm microcrystalline silicon is the most promising materiál for large area PN junction solar cells. As microcrystalline silicon is a heterogenous material composed of two phases (amorphous silicon tissue from which crystalline grains of micrometric dimension grow). The Raman spectra are commonly used to determine the crystallinity of mixed phase silicon thin lms by analyzing the contributions of amorphous and crystalline phase to TO phonon band. Many dierent empirical or semi-empirical methods of evaluating crystallinity from the Raman spectra exist. In this master's thesis the microcrystalline Raman spectra were studied and a better way of evaluating crystallinity was searched for. The decomposition of the microcrystalline spectra of the series of the samples, where a single deposition parameter was changing,by tting them with Gaussian bands was performed. We also report on the development of a special software for the band decomposition by non-linear least-squares tting based on Marquardt-Levenberg algorithm and demonstrate its use for a series of lms with structure changing from amorphous to fully microcrystalline.en_US
dc.languageČeštinacs_CZ
dc.language.isocs_CZ
dc.publisherUniverzita Karlova, Matematicko-fyzikální fakultacs_CZ
dc.titleMateriály pro sluneční články založené na tenkých vrstvách křemíkucs_CZ
dc.typerigorózní prácecs_CZ
dcterms.created2006
dcterms.dateAccepted2006-10-31
dc.description.departmentInstitute of Physics of Charles Universityen_US
dc.description.departmentFyzikální ústav UKcs_CZ
dc.description.facultyFaculty of Mathematics and Physicsen_US
dc.description.facultyMatematicko-fyzikální fakultacs_CZ
dc.identifier.repId44403
dc.title.translatedMaterials for Solar Cells Based on Thin Silicon Filmsen_US
dc.identifier.aleph001557474
thesis.degree.nameRNDr.
thesis.degree.levelrigorózní řízenícs_CZ
thesis.degree.disciplineOptics and optoelectronicsen_US
thesis.degree.disciplineOptika a optoelektronikacs_CZ
thesis.degree.programPhysicsen_US
thesis.degree.programFyzikacs_CZ
uk.thesis.typerigorózní prácecs_CZ
uk.taxonomy.organization-csMatematicko-fyzikální fakulta::Fyzikální ústav UKcs_CZ
uk.taxonomy.organization-enFaculty of Mathematics and Physics::Institute of Physics of Charles Universityen_US
uk.faculty-name.csMatematicko-fyzikální fakultacs_CZ
uk.faculty-name.enFaculty of Mathematics and Physicsen_US
uk.faculty-abbr.csMFFcs_CZ
uk.degree-discipline.csOptika a optoelektronikacs_CZ
uk.degree-discipline.enOptics and optoelectronicsen_US
uk.degree-program.csFyzikacs_CZ
uk.degree-program.enPhysicsen_US
thesis.grade.csUznánocs_CZ
thesis.grade.enRecognizeden_US
uk.abstract.enThin lm microcrystalline silicon is the most promising materiál for large area PN junction solar cells. As microcrystalline silicon is a heterogenous material composed of two phases (amorphous silicon tissue from which crystalline grains of micrometric dimension grow). The Raman spectra are commonly used to determine the crystallinity of mixed phase silicon thin lms by analyzing the contributions of amorphous and crystalline phase to TO phonon band. Many dierent empirical or semi-empirical methods of evaluating crystallinity from the Raman spectra exist. In this master's thesis the microcrystalline Raman spectra were studied and a better way of evaluating crystallinity was searched for. The decomposition of the microcrystalline spectra of the series of the samples, where a single deposition parameter was changing,by tting them with Gaussian bands was performed. We also report on the development of a special software for the band decomposition by non-linear least-squares tting based on Marquardt-Levenberg algorithm and demonstrate its use for a series of lms with structure changing from amorphous to fully microcrystalline.en_US
uk.file-availabilityV
uk.grantorUniverzita Karlova, Matematicko-fyzikální fakulta, Fyzikální ústav UKcs_CZ
thesis.grade.codeU
uk.publication-placePrahacs_CZ
uk.thesis.defenceStatusU
dc.identifier.lisID990015574740106986


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