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Photovoltaic silicon solar cells: study of materials and solar structures by the method of Fourier photoconductive spectroscopy
dc.contributor.advisorToušek, Jiří
dc.creatorHolovský, Jakub
dc.date.accessioned2017-03-27T08:46:33Z
dc.date.available2017-03-27T08:46:33Z
dc.date.issued2006
dc.identifier.urihttp://hdl.handle.net/20.500.11956/3773
dc.description.abstractThe use of Fourier transform infrared spectrometer for the measurement of Fourier Transform Photocurrent Spectroscopy (FTPS) has been recently reported and it is basis of this thesis. The main task of the thesis is extension of the FTPS to Surface Photovoltage (SPV) method. This method gives an unique possibility to evaluation of effective diffusion length L and effective surface recombination velocity (SRV) for thin or non-symmetrical semiconductor structures that can't be measured by standard techniques. These parameters play key role in good performance of solar cells absorbers. The experiments were carried out on c-Si material with surface passivated by silicon nitride. Sample is illuminated from the passivated side and the SPV signal is detected between the back capacitive contact and non-illuminated ohmic contact. One-dimensional continuity equation is solved to fit the measured spectrum. We have to ensure linearity of measured signal versus incident light intensity and account for frequency dependence. One measurement takes 30 seconds - that enables arbitrary variations. The influence of surface barrier height on SRV was assumed and additional constant illumination (light bias) was used to investigate its behavior and new relations were found. Beside SPV new elegant technique for interference...en_US
dc.languageČeštinacs_CZ
dc.language.isocs_CZ
dc.publisherUniverzita Karlova, Matematicko-fyzikální fakultacs_CZ
dc.titleFotovoltaické sluneční články na bázi křemíku: studium materiálů a solárních struktur metodou Fourierovské fotovodivostní spektroskopiecs_CZ
dc.typediplomová prácecs_CZ
dcterms.created2006
dcterms.dateAccepted2006-05-16
dc.description.departmentKatedra makromolekulární fyzikycs_CZ
dc.description.departmentDepartment of Macromolecular Physicsen_US
dc.description.facultyMatematicko-fyzikální fakultacs_CZ
dc.description.facultyFaculty of Mathematics and Physicsen_US
dc.identifier.repId42209
dc.title.translatedPhotovoltaic silicon solar cells: study of materials and solar structures by the method of Fourier photoconductive spectroscopyen_US
dc.contributor.refereeHlídek, Pavel
dc.identifier.aleph000837715
thesis.degree.nameMgr.
thesis.degree.levelmagisterskécs_CZ
thesis.degree.disciplinePhysics of condensed and macromolecular matteren_US
thesis.degree.disciplineFyzika kondenzovaných a makromolekulárních látekcs_CZ
thesis.degree.programPhysicsen_US
thesis.degree.programFyzikacs_CZ
uk.thesis.typediplomová prácecs_CZ
uk.taxonomy.organization-csMatematicko-fyzikální fakulta::Katedra makromolekulární fyzikycs_CZ
uk.taxonomy.organization-enFaculty of Mathematics and Physics::Department of Macromolecular Physicsen_US
uk.faculty-name.csMatematicko-fyzikální fakultacs_CZ
uk.faculty-name.enFaculty of Mathematics and Physicsen_US
uk.faculty-abbr.csMFFcs_CZ
uk.degree-discipline.csFyzika kondenzovaných a makromolekulárních látekcs_CZ
uk.degree-discipline.enPhysics of condensed and macromolecular matteren_US
uk.degree-program.csFyzikacs_CZ
uk.degree-program.enPhysicsen_US
thesis.grade.csVelmi dobřecs_CZ
thesis.grade.enVery gooden_US
uk.abstract.enThe use of Fourier transform infrared spectrometer for the measurement of Fourier Transform Photocurrent Spectroscopy (FTPS) has been recently reported and it is basis of this thesis. The main task of the thesis is extension of the FTPS to Surface Photovoltage (SPV) method. This method gives an unique possibility to evaluation of effective diffusion length L and effective surface recombination velocity (SRV) for thin or non-symmetrical semiconductor structures that can't be measured by standard techniques. These parameters play key role in good performance of solar cells absorbers. The experiments were carried out on c-Si material with surface passivated by silicon nitride. Sample is illuminated from the passivated side and the SPV signal is detected between the back capacitive contact and non-illuminated ohmic contact. One-dimensional continuity equation is solved to fit the measured spectrum. We have to ensure linearity of measured signal versus incident light intensity and account for frequency dependence. One measurement takes 30 seconds - that enables arbitrary variations. The influence of surface barrier height on SRV was assumed and additional constant illumination (light bias) was used to investigate its behavior and new relations were found. Beside SPV new elegant technique for interference...en_US
uk.file-availabilityV
uk.publication.placePrahacs_CZ
uk.grantorUniverzita Karlova, Matematicko-fyzikální fakulta, Katedra makromolekulární fyzikycs_CZ
dc.identifier.lisID990008377150106986


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